An understanding of surface kinetics is crucial to many areas of 2D and 3D film growth. A variety of techniques are currently available to extract surface kinetics parameters such as diffusion coefficients, atom attachment rates to islands and steps, etc. Most of these techniques, however, are limited to low coverages (i.e., single atom kinetics) and a limited temperature range (usually far from equilibrium). We have been developing a new technique, Temporal LEED Spectroscopy (TLS), that should be applicable over a much larger range of temperatures and up to densities where hydrodynamic diffusion equations are applicable.@footnote 1@ This technique uses the inherent intensity fluctuations, @delta@I(t) = I(q,t)-, in a surface diffraction experiment that are caused by the motion of steps, atoms, grain boundaries, etc. From these fluctuations a self auto-correlation function, G(@tau@)) = <@delta@I(t)@delta@I(t+@tau@)>, is constructed that contains the essential kinetics information. I will present a short discussion of how the technique works and the limits on its sensitivity and time resolution. As a specific example, I will show how kinetics information from a system of fluctuating steps on a vicinal surface can be extracted. Data will be presented for two systems where the step motion is governed by different rate limiting kinetics: stepped W(430) and stepped Si(111) surfaces. @FootnoteText@ @footnote 1@ E.H. Conrad, A. Menzel, S. Kiriukhin and M.C. Tringides, Phys. Rev. Lett. 81, 3175 (1998).