AVS 46th International Symposium
    Topical Conference on Emerging Opportunities and Issues in Nanotubes and Nanoelectronics Wednesday Sessions
       Session NT+NS+EM+MS-WeP

Paper NT+NS+EM+MS-WeP2
Nanoscale-controlled Handling of Carbon Nanotubes

Wednesday, October 27, 1999, 5:30 pm, Room 4C

Session: Poster Session
Presenter: O. Jaschinski, Universite Montpellier II, France
Authors: O. Jaschinski, Universite Montpellier II, France
P. Bernier, Universite Montpellier II, France
L. Vaccarini, Universite Montpellier II, France
C. Goze, Universite Montpellier II, France
G. Duesberg, Trinity College Dublin, Ireland
C. Journet, Max-Planck-Institut fuer Festkoerperforschung Stuttgart, Germany
S. Roth, Max-Planck-Institut fuer Festkoerperforschung Stuttgart, Germany
Correspondent: Click to Email
Carbon nanotubes are the most promising materials for applications in nanoelectronics and nanomechanics. For the determination of the electrical and mechanical properties of nanotubes and for the production of nanotube devices one needs the ability to handle nanoscale materials in a controlled way . We demonstrate how atomic force microscopy (AFM) can be used as a tool for manipulating and investigating carbon nanotubes. For an optimal use of AFM it is necessary to control the substrate-nanotube interaction. We present results of measurements of the mechanical properties of nanotubes obtained with various kinds of substrates. We show how the combination of lithography, manipulation by AFM and control of the adsorption process of nanotubes allow to prepare well defined sample configurations for very sophisticated measurements of the electrical and mechanical properties of carbon nanotubes. Based on these methods, techniques for the production of nanotube devices can be developed. This work was supported by European TMR contract NAMITECH ERBFMRX-CT96-0067 (DG12-MIHT)