AVS 46th International Symposium
    Topical Conference on Emerging Opportunities and Issues in Nanotubes and Nanoelectronics Friday Sessions
       Session NT+NS+EM+MS-FrM

Paper NT+NS+EM+MS-FrM6
Effect of Strain on Electrical Properties of Carbon Nanotubes

Friday, October 29, 1999, 10:00 am, Room 6C

Session: Nanotubes: Growth, Characterization and Properties II
Presenter: S. Paulson, University of North Carolina, Chapel Hill
Authors: S. Paulson, University of North Carolina, Chapel Hill
N. Snider, University of North Carolina, Chapel Hill
M.R. Falvo, University of North Carolina, Chapel Hill
A. Seeger, University of North Carolina, Chapel Hill
A. Helser, University of North Carolina, Chapel Hill
R.M. Taylor III, University of North Carolina, Chapel Hill
R. Superfine, University of North Carolina, Chapel Hill
S. Washburn, University of North Carolina, Chapel Hill
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We have used an advanced interface to an Atomic Force Microscope to apply strain to carbon nanotubes. Simultaneously, we measure the current voltage characteristics, and see how they change as a function of strain in the tube. We have applied enough strain to fracture nanotubes, causing the resistance to become infinitely large, and then reassembled the ends to form junctions. The characteristics of these junctions will be discussed, as well as other strain dependant effects.