AVS 46th International Symposium
    Nanometer-scale Science and Technology Division Monday Sessions
       Session NS1-MoA

Paper NS1-MoA4
Interaction Forces Measured with Functionalized Cantilevers and SFM Modulation Techniques

Monday, October 25, 1999, 3:00 pm, Room 612

Session: Nanoscale Tribology and Adhesion
Presenter: A.L. Szuchmacher, University of Washington
Authors: A.L. Szuchmacher, University of Washington
R. Luginbuehl, University of Washington
T. Engel, University of Washington
R.M. Overney, University of Washington
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Understanding local interaction forces between material surfaces is very important for many industrial and research applications such as tribology, materials science, bioengineering, and polymer science. The scanning force microscope allows for measuring forces acting at those interfaces. In order to understand the interactions between probe and material surfaces, the surface chemistry of the SFM tip must be well defined. Ultrasharp silicon cantilevers were reacted with different silanes to produce well defined and covalently bound monolayer films. The quality of these coatings was controlled by different techniques including ESCA and SFM. These tips were used to study the interactions of thin films using force-displacement curves and friction force measurements. Special SFM modulation techniques were applied to probe and image the interfacial interactions. Amplitude and phase response signals will be discussed. Fundamental effects of solvents on van der Waals interactions between surfaces were investigated as well as hydrogen bonding effects. Experiments were carried out as a function of surface chemistry, temperature, solvent, and pH.