AVS 46th International Symposium
    Magnetic Interfaces and Nanostructures Technical Group Monday Sessions
       Session MI-MoM

Paper MI-MoM4
Orientational Dependence of CMR Manganite Thin Films Observed with Ferromagnetic Resonance Spectroscopy

Monday, October 25, 1999, 9:20 am, Room 618/619

Session: New Magnetic Materials
Presenter: E.S. Gillman, Norfolk State University and Thomas Jefferson National Accelerator Facility
Authors: E.S. Gillman, Norfolk State University and Thomas Jefferson National Accelerator Facility
N. Noginov, Norfolk State University
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Previously we have observed that transport properties depend on crystal orientation and morphology in CMR manganite thin films.@footnote 1@ Here we present ferromagnetic resonance (FMR) data that shows that these films exhibit different properties that depend on thier relative orientation in an applied magnetic field. Single crystal films exhibit larger saturization magnetization when the applied field is perpendicular to the surface, but in polycrystalline films the opposite is true. On all films there is a broadening of the resonance peak near the ferromagnetic-paramagnetic transistion temperature that is characteristic of critical fluctuations. @FootnoteText@ @footnote 1@"Crystallinity and Magnetoresistance in La@sub x@Ca@sub 1-x@MnO@sub 3@ Thin Films'', E. S. Gillman, M. Li and K. -H. Dahmen, J. Appl. Phys., 84, 6217 (1998).