AVS 46th International Symposium
    Magnetic Interfaces and Nanostructures Technical Group Monday Sessions
       Session MI-MoM

Paper MI-MoM3
XPS Study of CMR Perovskite Thin Films: La@sub 0.65@D@sub 0.35@MnO@sub 3@ (D=Ca,Sr,Pb)

Monday, October 25, 1999, 9:00 am, Room 618/619

Session: New Magnetic Materials
Presenter: H. Dulli, University of Tennessee, Knoxville
Authors: P.A. Dowben, University of Nebraska, Lincoln
H. Dulli, University of Tennessee, Knoxville
B. Xu, University of Nebraska, Lincoln
Q.L. Xu, University of Nebraska, Lincoln
S.H. Liou, University of Nebraska, Lincoln
Correspondent: Click to Email
Surface segregation phenomenon has been investigated in crystalline films of La@sub 0.65@D@sub 0.35@MnO@sub 3@ (D=Ca,Sr,Pb) by angular resolved XPS. We found that surface concentration of the dopant atoms is different from the bulk. Using a binary alloy model, we constructed depth profiles for the above dopants. The surface segregation was most significant in the case of Sr-doped films which also exhibit a surface insulating phase at low temperature as can be seen clearly from the binding energy shift in the core level spectra.