AVS 46th International Symposium
    Magnetic Interfaces and Nanostructures Technical Group Monday Sessions
       Session MI-MoM

Paper MI-MoM10
Epitaxial Growth of La-Ca-Mn-O Thin Film on Out-of-Plane Twinned LaAlO@sub 3@

Monday, October 25, 1999, 11:20 am, Room 618/619

Session: New Magnetic Materials
Presenter: J.-H. Song, Korea Institute of Science and Technology
Authors: J.-H. Song, Korea Institute of Science and Technology
K.K. Kim, Korea Institute of Science and Technology
J.H. Song, Korea Institute of Science and Technology
D.-K. Choi, Hanyang University, Korea
Y.J. Oh, Korea Institute of Science and Technology
H.-J. Jung, Korea Institute of Science and Technology
W.K. Choi, Korea Institute of Science and Technology
Correspondent: Click to Email
LCMO thin film with 145 nm thickness was epitaxially grown on LaAlO@sub 3@ (100) substrate using RF magnetron sputtering. The crystalline structure of LCMO thin film on LaAlO@sub 3@ was characterized using backscattering (BS)/channeling and 4-circle X-ray diffractometer. Thin film grown at 600@sup o@C and 100 W shows the minimum channeling yield of 4.98%. XRD @theta@-rocking also showed the FWHM of 0.311@sup o@ for LCMO (200) peak, which is quite small compared to the previous reported values of 0.4@sup o@-0.5@sup o@. But the @theta@-rocking curve seemed to be composed of 2 peaks which was known due to strained-layer and relaxed-layer. In the RBS <001> and <011> BS/channeling study, only <011> direction showed difference by 1.12@sup o@. In addition, we observed the substrate has the out-of-plane twinned structure from hight resolution XRD @theta@-rokcing on LaAlO@sub 3@ (200) peak. From above results, we confirmed the film with only strained layer was epitaxially grown on the out-of-plane twinned substrate. The full width at half maximum value of XRD @theta@-rocking on LCMO film (200) peak was 0.147@sup o@ after BS/channeling analysis. This value is smaller value than any other reported values of LCMO on LaAlO@sub 3@.