AVS 46th International Symposium
    Applied Surface Science Division Tuesday Sessions
       Session AS-TuP

Paper AS-TuP11
Characterization of Chemically Heterogeneous Samples Using XPS Imaging and Small Area Analysis

Tuesday, October 26, 1999, 5:30 pm, Room 4C

Session: Poster Session
Presenter: A.C. Ferryman, Kent State University
Authors: A.C. Ferryman, Kent State University
J.E. Fulghum, Kent State University
Correspondent: Click to Email
Recent advances in XPS instrumentation allow for the rapid acquisition of photoelectron images with a spatial resolution of a few microns. This capability both expands the range of samples which can be characterized using XPS, and provides additional complications in data interpretation and analysis. For samples which have a surface roughness comparable to the depth- of-focus within the image, care must be taken to distinguish between surface roughness effects and changes in chemical state or elemental distribution. Sandstones coated with a commercial perfluoropolyether for protection from weathering were characterized using imaging and small area XPS. Polymer impregnation into the stone, and uniformity of the polymer coating were characterized through analysis of both cross-sections and the surface of the sandstone. Variations in polymer distribution on both macro- and micro-scales will be discussed and evidence for polymer segregation between components of the sandstone evaluated. This system provides an example of the information which can be obtained, and artifacts which must be considered, in the analysis of a chemically heterogeneous sample which also contains significant surface roughness.