AVS 46th International Symposium
    Applied Surface Science Division Monday Sessions
       Session AS-MoM

Paper AS-MoM1
Reading Mechanism Evaluation on Detection of Spontaneous Polarization in a PZT Thin Film

Monday, October 25, 1999, 8:20 am, Room 6A

Session: Imaging and Small Area Analysis
Presenter: W. Moon, Pohang University of Science and Technology, Republic of Korea
Authors: W. Moon, Pohang University of Science and Technology, Republic of Korea
H. Shin, Samsung Advanced Institute of Technology, Republic of Korea
J. Lee, Samsung Advanced Institute of Technology, Republic of Korea
K. Lee, Samsung Advanced Institute of Technology, Republic of Korea
Y.E. Pak, Samsung Advanced Institute of Technology, Republic of Korea
Correspondent: Click to Email
The methods for detecting a small polarized area in a PZT thin film by SPM techniques are investigated theoretically and experimentally. A small polarized area in a PZT thin film can be constructed and detected by use of SPM. It is found that a 4 µ m by 4 µ m polarized area can be more easily detected by use of EFM techniques under contact-mode-AFM operation. It is shown experimentally as well as theoretically that effects of electrostatic forces are dominant for detection signals for polarized domains in a PZT thin film compared with piezoelectric vibration effects.