AVS 45th International Symposium
    Vacuum Technology Division Monday Sessions

Session VT-MoP
Vacuum Technology Poster Session

Monday, November 2, 1998, 5:30 pm, Room Hall A


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Click a paper to see the details. Presenters are shown in bold type.

VT-MoP1
Behavior of the Negative Collector Current in Ionization Vacuum Gauges
K. Kokubun, M. Hirata, Electrotechnical Laboratory, Japan
VT-MoP2
Compatibility of a Control Unit and a Sensing Coil Unit with a Rotor Ball of a Spinning Rotor Gauge
M. Hirata, Electrotechnical Laboratory, Japan
VT-MoP3
A New High-Power Ion Source Based on Magnetically Neutral Loop Discharge
F. Shimokawa, NTT Opto-electronics Laboratories, Japan
VT-MoP4
Stabilization of Long Travel - Single Bellows - Horizontal Manipulators
V.S. Smentkowski, A.L. Linsebigler, General Electric Corporate Research and Development Center
VT-MoP5
Pressure Wave Propagation by Gas Expansion in a High Vacuum Tube
T. Takiya, Hitachi Zosen Corporation, Japan, F. Higashino, Tokyo Noko University, Japan, Y. Terada, A. Komura, Hitachi Zosen Corporation, Japan
VT-MoP6
Measurement of Secondary Electron Yields of Copper Materials and the Surface Analysis
S. Kato, K. Kanazawa, KEK, Japan, N. Kitano, N. Matsuda, Tokyo Denki University, Japan
VT-MoP7
Study of Field Emission Properties of GaN grown by ECR MBE
I.E. Berishev, O. Kameli, D. Starikov, A. Bensaoula, I. Rusakova, University of Houston, V.P. Ageev, M.V. Ugarov, A. Korabutov, General Physics Institute, Russia
VT-MoP8
Outgassing Tests on Materials Used in the DIII-D Tokamak@footnote 1@
K. Holtrop, M. Hansink, A.G. Kellman, General Atomics
VT-MoP9
Simple Catalytic Cell for Restoring He Leak Detector Sensitivity on Vacuum Systems with High D@sub 2@ Backgrounds*
J. Busath, H.K. Chiu, General Atomics