AVS 45th International Symposium | |
Surface Science Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
8:20am | SS1+NS-ThM1 Invited Paper Peter Mark Memorial Award Address - Morphology of Epitaxial Films during Low Temperature Growth D.G. Cahill, University of Illinois, Urbana-Champaign |
9:00am | SS1+NS-ThM3 The Influence of Dislocations on the Intermixing Kinetics of Pd-Au Monolayer Films O. Schaff, A.K. Schmid, M.C. Bartelt, R.Q. Hwang, Sandia National Laboratories |
9:20am | SS1+NS-ThM4 The Kinetic Nature of Slope Selection during Unstable Growth S. van Dijken, L.C. Jorritsma, B. Poelsema, University of Twente, The Netherlands |
9:40am | SS1+NS-ThM5 Growth on Cu(100) Using Improved Simulation Algorithm@footnote 1@ J.G. Amar, University of Toledo, M.R. D'Orsogna, T.L. Einstein, University of Maryland, College Park, I. Beichl, National Institute of Standards and Technology, F. Sullivan, Center for Computing Sciences |
10:00am | SS1+NS-ThM6 The Atomistics of Homoepitaxial Growth on bcc(110)-Surfaces U.K. Koehler, C. Jensen, A. v. Stockhausen, Ruhr-Universitaet Bochum, Germany |
10:20am | SS1+NS-ThM7 Invited Paper Probing the Forces Stabilizing Self-Assembled Structures: Dynamics of Vacancy Island Lattices in Ag films on Ru(0001) K. Pohl, M.C. Bartelt, J. de la Figuera, N.C. Bartelt, Sandia National Laboratories, J. Hrbek, Brookhaven National Laboratory, R.Q. Hwang, Sandia National Laboratories |
11:00am | SS1+NS-ThM9 STM Study of Ultrathin NaCl(111) Layers on Aluminum W. Hebenstreit, J. Redinger, TU Vienna, Austria, R. Podloucky, University Vienna, Austria, M. Schmid, P. Varga, TU Vienna, Austria |
11:20am | SS1+NS-ThM10 Three-Dimensional SiGe Island Density on Si(001) and Morphology After Si Overgrowth@footnote 1@ J.S. Sullivan, E. Mateeva, H. Evans, D.E. Savage, M.G. Lagally, University of Wisconsin, Madison |
11:40am | SS1+NS-ThM11 Effects of Ion Pretreatments on the Nucleation of Silicon on Silicon Dioxide C Basa, University of North Carolina, Chapel Hill, Y.Z. Hu, AG Associates Inc., M.T. Tinani, E.A. Irene, University of North Carolina, Chapel Hill |