| AVS 45th International Symposium | |
| Thin Films Division | Tuesday Sessions |
| Session TF-TuM |
| Session: | Thin Films for Sensing and Data Storage |
| Presenter: | R.W. Walton, National Institute of Standards and Technology |
| Authors: | R.W. Walton, National Institute of Standards and Technology R.E. Cavicchi, National Institute of Standards and Technology J.D. Allen, National Institute of Standards and Technology S. Semancik, National Institute of Standards and Technology |
| Correspondent: | Click to Email |