AVS 45th International Symposium | |
Thin Films Division | Tuesday Sessions |
Session TF-TuM |
Session: | Thin Films for Sensing and Data Storage |
Presenter: | R.W. Walton, National Institute of Standards and Technology |
Authors: | R.W. Walton, National Institute of Standards and Technology R.E. Cavicchi, National Institute of Standards and Technology J.D. Allen, National Institute of Standards and Technology S. Semancik, National Institute of Standards and Technology |
Correspondent: | Click to Email |