| AVS 45th International Symposium | |
| Thin Films Division | Tuesday Sessions |
| Session TF-TuM |
| Session: | Thin Films for Sensing and Data Storage |
| Presenter: | H. Meixner, Siemens AG, Germany |
| Authors: | H. Meixner, Siemens AG, Germany M. Fleischer, Siemens AG, Germany |
| Correspondent: | email address not available |