AVS 45th International Symposium | |
Thin Films Division | Tuesday Sessions |
Session TF-TuM |
Session: | Thin Films for Sensing and Data Storage |
Presenter: | H. Meixner, Siemens AG, Germany |
Authors: | H. Meixner, Siemens AG, Germany M. Fleischer, Siemens AG, Germany |
Correspondent: | email address not available |