AVS 45th International Symposium | |
Thin Films Division | Tuesday Sessions |
Session TF-TuM |
Session: | Thin Films for Sensing and Data Storage |
Presenter: | D. Weller, IBM Almaden Research Center |
Authors: | D. Weller, IBM Almaden Research Center A. Moser, IBM Almaden Research Center |
Correspondent: | Click to Email |