| AVS 45th International Symposium | |
| Thin Films Division | Tuesday Sessions |
| Session TF-TuM |
| Session: | Thin Films for Sensing and Data Storage |
| Presenter: | D. Weller, IBM Almaden Research Center |
| Authors: | D. Weller, IBM Almaden Research Center A. Moser, IBM Almaden Research Center |
| Correspondent: | Click to Email |