Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2018)
    Thin Films Thursday Sessions
       Session TF-ThM

Paper TF-ThM3
Epitaxial GdFe0.8Ni0.2O3 Multiferroic Thin Films Grown Device Using Operando X-ray Technique

Thursday, December 6, 2018, 8:40 am, Room Naupaka Salons 4

Session: Nanostructured Surfaces and Thin Films: Synthesis and Characterization III
Presenter: Shu-Jui Chang, National Chiao Tung University, Republic of China
Authors: S.-J. Chang, National Chiao Tung University, Republic of China
M.-H. Chung, National Chiao Tung University, Republic of China
Y.-T. Liu, National Synchrotron Radiation Research Center
H.-Y. Lee, National Synchrotron Radiation Research Center
Y.-C. Tseng, National Chiao Tung University, Republic of China
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Complex oxides have been extensively investigated due to complicated structural and electronic orbitals. The physical properties of these oxides may vary with growth mechanism. Among all the growing methods, radio frequency (RF) sputtering possesses advantages of good stoichiometry, great reproducibility and less pricy. This work demonstrates the fabrication of epitaxial GdFe0.8Ni0.2O3 thin Film (abbreviated as GFNO) by RF sputtering, analysis of fundamental physical properties and the application in the research in ferromagnetic and multiferroic layer heterostructure interface with in-situ spectroscopy technique. The epitaxial nature properties of thin film were examined by synchrotron radiation high resolution X-ray scattering at NSRRC. In addition to structure, the analysis on ferroelectricity (polarization and leakage), magnetism, electronic configuration and valence state have been also conducted with the result of room-temperature ferroelectricity and ferrimagnetism of GFNO thin film. Using in-situ XAS, XMCD and MOKE analysis have been conducted to investigate the effect of the electric field on the Co and GFNO interface. The native cobalt oxide in the interface has been found to transfer into metallic state due to the enhancement in the intensity of XAS absorption peak. Meanwhile, the intensity of XMCD also increases, indicating that the spin moment has also increases. In MOKE analysis, the coercivity of cobalt declines with rising applied electric filed which comes from the increase in metallic state cobalt. This work was financially supported by the “Center for the Semiconductor Technology Research” from The Featured Areas Research Center Program within the framework of the Higher Education Sprout Project by the Ministry of Education (MOE) in Taiwan. Also supported in part by the Ministry of Science and Technology, Taiwan, under Grant MOST-107-3017-F-009-002.