Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2016)
    Thin Films Wednesday Sessions
       Session TF-WeP

Paper TF-WeP18
In-situ Visualization of Graphene Grain Boundary by Optical Microscopy

Wednesday, December 14, 2016, 4:00 pm, Room Mauka

Session: Thin Films Posters Session II
Presenter: Yekyung Kim, Korea Electronics Technology Institute (KETI), Republic of Korea
Authors: K.-P. Hong, Korea Electronics Technology Institute (KETI), Republic of Korea
S.-H. Park, Korea Electronics Technology Institute (KETI), Republic of Korea
D.-J. Oh, Korea Electronics Technology Institute (KETI), Republic of Korea
Y. Kim, Korea Electronics Technology Institute (KETI), Republic of Korea
K.-S. Kim, Sejong University, Republic of Korea
K.-H. Kim, Sungkyunkwan University, Republic of Korea
J.-B. Choi, Sungkyunkwan University, Republic of Korea
H. Kim, Korea Electronics Technology Institute (KETI), Republic of Korea
Correspondent: Click to Email

The graphene consisting with carbon atoms to honeycomb structure has the excellent properties about mechanical, chemical and thermal and it has been research in a variety of fields. In order to commercialize graphene with these outstanding properties, as well as a large area, mass production is essential for precise and fast measurement. In this study, for measuring the shape and size of the oxidation graphene fast and precisely, we configured the measuring system with an optical microscope, a heating stage and 3 W level laser. Through the configured system we can keep the graphene in a vacuum and wet condition to 200 ℃ and measure the grain boundary of the oxidation graphene by irradiating the laser to locally. Later by proceeding the additional experiment and analyzing the correlation between the degree of graphene oxide and the laser irradiation time, through this process we develop the optimized visualization method of the graphene defects.