Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2016)
    Thin Films Wednesday Sessions
       Session TF-WeE

Paper TF-WeE8
RF-Sputtering Reactive used for Depositing Thin Films CdS:O

Wednesday, December 14, 2016, 8:00 pm, Room Makai

Session: Microstructure & Surface Morphological Evolution in Organic & Inorganic Films
Presenter: Juan Luis Pena Chapa, CINVESTAV-IPN Unidad Merida, Mexico
Authors: J.L. Pena Chapa, CINVESTAV-IPN Unidad Merida, Mexico
M. Loeza-Poot, CINVESTAV-IPN Unidad Merida, Mexico
I. Rimmaudo, CINVESTAV-IPN Unidad Merida, Mexico
I. Riech Mendez, Universidad Autónoma de Yucatán, Mexico
R. Mis Fernandez, CINVESTAV-IPN Unidad Merida, Mexico
V. Rejon Moo, CINVESTAV-IPN Unidad Merida, Mexico
Correspondent: Click to Email

We present the effects of the variation oxygen concentration in the thin films of CdS:O deposited by RF-Sputtering. This kind of thin film was studied with the purpose to be used as a window layer in a solar cell. The films were deposited on Corning glass substrate (area 1 in2) from a ceramic target of CdS with 99.99% purity, in an atmosphere of mixture of gases Ar + O2. Deposition was performance at room temperature with a working pressure of 25 mTorr and a sputtered power of 40 Watts. Films with different oxygen content were prepared with a variation of the oxygen concentration in a range from 1% to 1.5% with respect to the total pressure . The structural and morphological properties were characterized by using X-ray Diffraction (XRD) and field emission scanning electron microscopy (FE-SEM), respectively. The diffraction patterns showed that samples prepared with oxygen concentration less to 1.1% are crystalline and present the hexagonal CdS (h-CdS) structure, while samples with oxygen concentrations greater than 1.1% are amorphous, all crystalline films were oriented preferentially (002). Also we observed a decrease in the crystallite size in a range from 5.9 nm to 4.3 nm, which can be correlated in the micrographs. SEM images show that is possible to obtain nanostructure thin films of CdS varying the grain size in a range from 20nm to 70nm, the grain size decrease as the oxygen percentage raises, all samples present high uniformity.

ACKNOWLEDGEMENTS: This work has been supported by CONACYT-SENER (México) under projects CeMiESol 207450/P25 and CeMiE-Sol 207450/P26. M. Loeza-Poot acknowledges CONACYT-Mexico for scholarship (number 556332) in the Applied Physics Department of CINVESTAV-Merida. . Measurements were performed at LANNBIO CINVESTAV-Mérida, supported from projects FOMIX-Yucatán 2008-108160, CONACYT LAB-2009-01 No. 123913 and CB2012/ 178947. The authors gratefully acknowledge to D. Huerta and Wiliam Cauich for technical support, and to L. Pinelo as secretarial assistant.