Paper NM-WeM11
Nanoscale Chemical Imaging with Photo-induced Force Microscopy

Wednesday, December 14, 2016, 11:20 am, Room Hau

Infrared Photo-induced Force Microscopy (IR PiFM) is based on an atomic force microscopy (AFM) platform that is coupled to a widely tunable mid-IR laser. PiFM measures the dipole induced at or near the surface of a sample by an excitation light source by detecting the dipole-dipole force that exists between the induced dipole in the sample and the mirror image dipole in the metallic AFM tip. This interaction is strongly affected by the optical absorption spectrum of the sample, thereby providing a significant spectral contrast mechanism which can be used to differentiate between chemical species. Due to its AFM heritage, PiFM acquires both the topography and spectral images concurrently and naturally provides information on the relationship between local chemistry and topology with sub 10 nm spatial resolution on a variety of samples. PiFM spectral images surpass spectral images that are generated via other techniques such as scanning transmission X-ray microscopy (based on synchrotron source), micro confocal Raman microscopy, and electron microscopes, both in spatial resolution and chemical specificity. The breadth of the capabilities of PiFM will be highlighted by presenting data on various polymer systems. By enabling imaging at the nm-scale with chemical specificity, PiFM provides a powerful new analytical method for deepening our understanding of nanomaterials and facilitating technological applications of such materials.