Course

Given

No of days

Abbreviated Course in Surface Spectroscopies

1986-

1

1980

1

Advanced Surface Analysis-Ion Stimulation

1981

1

Auger Electron Spectroscopy

1989-

1

Atomic Force and Scanning Tunneling Microscopy

2000

1

Comprehensive Course on Surface Analysis: AES, XPS, SIMS and Depth Profiling

1992

4

Depth Profiling

1987

1

Focused Ion Beams: Principles and Applications

2000

1

Full Wafer Particle and Defect Detection, Review and Characterization

2000

1

Fundamentals and Applications of Variable-Angle Spectroscopic Ellipsometry

1985-

2

Fundamentals of Surface Science

1985-

2

Fundamentals of Semiconductor Characterization: Electrical and Optical Techniques

1991

1

Introduction to Ellipsometry

1992

1

Introduction to Surface Analysis Techniques

1992

1

Ion Scattering Spectroscopy (ISS)

1989

0.5

Magnetic Force Microscopy: Methods and Applications in Data Storage

1996

1

Materials and Surface Microcharacterization and Analysis

1995

2

Overview of Methods of Surface Analysis

1991

1

Recent Advances in Surface Science techniques

1992

1

Rutherford Backscattering Spectrometry (RBS) and Related Spectroscopies

1989

0.5

Scanning Electron Microscope Techniques for Materials Analysis

1987

1

Scanning Electron Microscopy of Semiconductor Materials and Devices

1991-

1

Scanning Electron Microscopy

1992

1

Scanning Electron Microscopy and X-ray Analysis in Materials Science

1992

1

Scanning Tunneling Microscopy

1987

1988

2

1

Scanning Tunneling Microscopy: Instrumentation and Practice

1989-

1

Scanning Tunneling and Atomic Force Microscopy

1991

1

Secondary Ion and Neutral Mass Spectroscopies (SIMS, SNMS, SALI)

1986-

2

Secondary Ion Mass Spectrometry

1996

1

Surface Analysis

1976-

2

Surface Analysis Techniques

1986

2

Surface Analysis: The Major Methods

1996

2

Surface Analysis: Electron and other Emerging Spectroscopies

1985-

2

Surface Analysis: Ion Spectroscopies

1985

1987

1

2

Surface Characterization of Biomaterials

2000

1

Transmission Electron Microscopy

2000

1

Transmission Electron Microscopy in the Fab

1999

1

X-Ray Photoelectron Spectroscopy (XPS/ESCA)

1989-

1