AVS 64th International Symposium & Exhibition
    Tandem MS Focus Topic Monday Sessions

Session TM+AS-MoM
New Instrumentation Featuring Tandem MS

Monday, October 30, 2017, 8:20 am, Room 5 & 6
Moderators: Chris Anderton, Pacific Northwest National Laboratory, Daniel Graham, University of Washington


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:20am TM+AS-MoM1 Invited Paper
In Situ MS/MS Analysis on Biological Samples using Imaging Secondary Ion Mass Spectrometry (SIMS)
Hua Tian, Pennsylvania State University
9:00am TM+AS-MoM3
Molecular Depth Profiling with a New Hybrid SIMS Instrument for Improved Molecular Identification using Tandem MS
Alexander Pirkl, R. Moellers, H.F. Arlinghaus, J. Zakel, D. Rading, E. Niehuis, ION-TOF GmbH, Germany
9:20am TM+AS-MoM4
Spatially-resolved Tandem Mass Spectrometry Increases Molecular Confidence in a Multimodal Mass Spectrometry Imaging Investigation of a Tripartite Plant-fungus-cyanobacteria Interaction
Dušan Veličković, Pacific Northwest National Laboratory, A.A. Carrell, Duke University, R.K. Chu, Pacific Northwest National Laboratory, D. Pelletier, Oak Ridge National Laboratory, L. Paša-Tolić, Pacific Northwest National Laboratory, D.J. Weston, Oak Ridge National Laboratory, C.R. Anderton, Pacific Northwest National Laboratory
9:40am TM+AS-MoM5
The Biosynthesis of Protective Metabolites in Amazonian Sextonia rubra Revealed by 100 nm-Scale TOF-SIMS Tandem MS Imaging
Gregory L. Fisher, Physical Electronics, T. Fu, D. Touboul, Institut de Chimie des Substances Naturelles, CNRS, France, S. Della-Negra, Institut de Physique Nucléaire, CNRS, France, E. Houël, N. Amusant, C. Duplais, Cirad, UMR EcoFoG, AgroParisTech, CNRS, INRA, France, A. Brunelle, Institut de Chimie des Substances Naturelles, CNRS, France
10:40am TM+AS-MoM8 Invited Paper
Metabolite Annotation for Ultra-HR Imaging Mass Spectrometry: MS1 and Beyond
Theodore Alexandrov, European Molecular Biology Laboratory, Germany
11:20am TM+AS-MoM10
Multivariate Analysis of combined ToF-SIMS and Orbitrap-SIMS data
Henrik Arlinghaus, M.R. Keenan, A. Pirkl, R. Moellers, E. Niehuis, ION-TOF GmbH, Germany