| AVS 64th International Symposium & Exhibition | |
| Exhibitor Technology Spotlight Workshops | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 12:40pm | EW-TuL2 Design and Application of a New Laboratory-Based Scanning XPS/HAXPES Instrument R. Inoue, H. Yamazui, K. Watanabe, ULVAC-PHI, Japan, S.R. Bryan, John Newman, J.E. Mann, Physical Electronics |
| 1:00pm | EW-TuL3 Application of X-ray Photoelectron Spectroscopy for the Characterisation of Biomaterials C. Moffitt, Kratos Analytical Ltd, D. Surman, Kratos Analytical Limited, S.J. Coultas, Jonathan Counsell, Kratos Analytical Limited, UK |
| 1:20pm | EW-TuL4 Advanced Photoelectron Spectroscopies Setup As a Key for Current Research Lukasz Walczak, PREVAC, Poland |
| 1:40pm | EW-TuL5 Advanced Ion Beam Techniques for Thin Films and Structuring Marcel Demmler, AARD |
| 2:00pm | EW-TuL6 From Surface Spectrometry to 3D Analysis - Latest Trends and Instrumentation for TOF-SIMS Nathan Havercroft, ION-TOF USA, R. Moellers, A. Pirkl, ION-TOF GmbH, Germany |