| AVS 64th International Symposium & Exhibition | |
| Scanning Probe Microscopy Focus Topic | Tuesday Sessions |
| Session SP+AS+MI+NS+SS-TuA |
| Session: | Probe-Sample Interactions |
| Presenter: | Yoichi Miyahara, McGill University, Canada |
| Authors: | Y. Miyahara, McGill University, Canada A. Roy-Gobeil, McGill University, Canada P.H. Grutter, McGill University, Canada |
| Correspondent: | Click to Email |
Electric charge detection by atomic force microscopy (AFM) with single-electron resolution (e-EFM) is a promising way to investigate the electronic level structure of individual quantum dots (QD). The mechanical oscillation of the AFM tip modulates the energy of the QDs, causing single electrons to tunnel back and forth between QDs and an electrode. The resulting oscillating electrostatic force changes the resonant frequency and damping of the AFM cantilever, enabling electrometry with a single-electron sensitivity. While quantitative electronic level spectroscopy is possible by sweeping the bias voltage, charge stability diagram of the QD can be obtained by scanning the AFM tip around the QD. e-EFM technique can be applied for the investigation of individual colloidal nanoparticles and self-assembled QDs without defining nanoscale electrodes. e-EFM is a quantum electromechanical system where the back-action of a tunneling electron is detected by AFM and can also be regarded as a mechanical analog of admittance spectroscopy with a radio frequency resonator, which is emerging as a promising tool for quantum state readout for quantum information processing. In combination with the topography imaging capability of the AFM, e-EFM is a powerful tool for investigating nanoscale material systems which can be used as quantum bits such as nanowires and single molecules and dopants.
1 Y. Miyahara, A. Roy-Gobeil and P. Grutter, Nanotechnology 28, 064001 (2017).