AVS 64th International Symposium & Exhibition | |
Scanning Probe Microscopy Focus Topic | Tuesday Sessions |
Session SP+AS+MI+NS+SS-TuA |
Session: | Probe-Sample Interactions |
Presenter: | Tae-Hwan Kim, Pohang University of Science and Technology, Republic of Korea |
Authors: | H.K. Kim, Pohang University of Science and Technology, Republic of Korea T. Ahn, Pohang University of Science and Technology, Republic of Korea T.S. Youn, Pohang University of Science and Technology, Republic of Korea D.G. Lee, Pohang University of Science and Technology, Republic of Korea T.-H. Kim, Pohang University of Science and Technology, Republic of Korea |
Correspondent: | Click to Email |
Graphene, a single sheet of sp2-bonded carbon atoms, is considered as a promising material for future electronic devices especially due to its superior electron mobility as well as mechanical stability. For various applications of graphene, however, the electronic structure has to be tuned and the diverse functionalization is strongly required. In particular, it has been well known that the oxidation of graphene can alter its electronic and optical properties remarkably. We have investigated the atomic oxygen chemisorbed on the epitaxial graphene using scanning tunneling microscopy (STM). The high-resolution topographic images and tunneling spectroscopy spectra reveal distinctive electronic states of oxygen atoms, which bridge two adjacent carbon atoms and make graphene epoxide. More importantly, using the STM tip can controllably induce the local removal and the rearrangement of the atomic oxygen by applying the appropriate biases. The technique is similar to the STM nanolithography, which has been reported, for example, for hydrogenated Si(001). In principle, a combination of the controlled desorption and hopping of atomic oxygen can be employed to design the local electronic property on graphene with atomic-scale precision, which may lead to advanced atomic-scale devices based on graphene.