| AVS 64th International Symposium & Exhibition | |
| Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic | Tuesday Sessions |
| Session SA-TuP |
| Session: | Synchrotron and FEL-Based Analysis Poster Session |
| Presenter: | Susanna Eriksson, Scienta Omicron |
| Authors: | S.E. Eriksson, Scienta Omicron P.P. Palmgren, Scienta Omicron M.P. Patt, Scienta Omicron M.H. Heiss, Scienta Omicron P.B. Baumann, Scienta Omicron P.Z. Zeigermann, Scienta Omicron P.W. Wiell, Scienta Omicron K.B. Backlund, Scienta Omicron C.L. Liljenberg, Scienta Omicron M.L. Lundqvist, Scienta Omicron |
| Correspondent: | Click to Email |
During the past decade, increased attention has been shown to hard X-rays in the photoelectron spectroscopy field. This is mainly due to the increased information depth enabled by the higher photon energies. Such bulk sensitive measurements could previously only be performed at dedicated synchrotron radiation facilities. The beam lines providing this type of radiation are heavily booked, so access to the experimental setups is thus limited.
We now present a novel product featuring a monochromized X-ray source giving out Ga Ka radiation at 9.25 keV and a wide acceptance angle hemispherical electron analyzer, both combined on a simple to use vacuum system. The base system can easily be customized by adding separate modules such as a MBE- or preparation chamber or a glove box. With this novel base system, a new set of possible experiments opens up in the home laboratory: investigations of buried interfaces, in operando devices, real world samples, etc. Such samples or conditions have previously been unattainable with the limited information depth of traditional XPS.
At the heart of the system is a liquid jet of a molten Ga-rich alloy. Electrons which are accelerated into this jet generate an intense Ga Ka radiation. These X-rays are monochromized and refocused using an ellipsoidal mirror in a Rowland geometry. The small spot size of 20 µm provided by the liquid jet source is maintained throughout the passing of the monochromator and only slightly broadened to about 50 µm. The photon energy width is targeted at 0.5 eV, suitable for the typical intrinsic core level width at the relatively high photon energy. In order to allow for easy adjustment of the X-ray focal point relative to the electron analyzer, the entire assembly of monochromator and source can be moved down to a precision of a few micrometers. The hemispherical electron analyzer is configured for high kinetic energies allowing for detection of the full energy range the source provides, a large acceptance angle of +/- 30 degrees
We present prototype data taken from polycrystalline gold and silicon wafers with a surface layer of silicon dioxide with a controlled thickness.