| AVS 64th International Symposium & Exhibition | |
| Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic | Tuesday Sessions |
| Session SA+AS+HC+SS-TuA |
| Session: | Frontiers of Photoelectron Spectroscopy: Surface & Interface Processes with Variable Depth Probe, High Spatial or Temporal Resolution |
| Presenter: | Deidra Hodges, University of Texas at El Paso |
| Authors: | D.R. Hodges, University of Texas at El Paso S. Shahriar, University of Texas at El Paso A.K. Mishra, University of Texas at El Paso V. Castaneda, University of Texas at El Paso V. Vidal, University of Texas at El Paso M. Martinez, University of Texas at El Paso N. Garcia, University of Texas at El Paso J. Munoz, University of Texas at El Paso J. Lopez, University of Texas at El Paso |
| Correspondent: | Click to Email |
Recently, the methylammonium lead iodide CH3NH3PbI3 perovskites have attracted a lot of attention as a possible absorber material for thin film solar cells due to their bandgap energy, high optical absorption coefficients and low-cost solution-processing deposition approaches. Methylammonium lead iodide CH3NH3PbI3 perovskite solar cells have evolved with transformative potential with laboratory efficiencies greater than 20%. Perovskite absorber materials are very inexpensive to synthesize and simple to manufacture, making them an extremely commercially viable option. Solar cell efficiencies of devices using these materials have increased from 3.8% in 2009 to a Newport certified 20.1% in 2015, making this the fastest-advancing solar cell technology to date. These devices are known for their high photon absorptivity, tunable large direct band gaps with superior carrier charge transports, and low-cost methods of fabrication. Methylammonium lead tri-iodide CH3NH3PbI3 perovskites thin films and single crystals were prepared for synchrotron-based X-ray spectroscopy studies of the perovskite materials surfaces and properties. The perovskite thin films and single crystals were characterized at the National Synchrotron Light Source (II) (NSLS-II) at Brookhaven National Laboratory (BNL). Synchrotron-radiation-based chemical analysis using X-ray fluorescence (XRF), and X-ray absorption near edge structure (XANES) spectroscopy were performed on samples for detailed analysis into chemical composition, stoichiometry, and material surface properties.