| AVS 64th International Symposium & Exhibition | |
| Biomaterial Interfaces Division | Thursday Sessions |
| Session BI+AS+SA-ThM |
| Session: | Characterisation of Biological and Biomaterial Surfaces |
| Presenter: | Jonathan Counsell, Kratos Analytical Limited, UK |
| Authors: | J.D.P. Counsell, Kratos Analytical Limited, UK S.J. Coultas, Kratos Analytical Limited, UK C.J. Blomfield, Kratos Analytical Limited, UK C. Moffitt, Kratos Analytical S.J. Hutton, Kratos Analytical Limited, UK |
| Correspondent: | Click to Email |
XPS is widely used in the field of biomaterials yielding quantitative elemental and chemical state information [1]. It is possible to identify changes in functional groups present both on the surface and, combined with depth profiling, within the bulk of a biomaterial.
Here we will discuss the latest advancements in XPS as applied to a range of biomaterial systems and examine new possibilities beyond routine spectroscopic analysis. Non-destructive depth profiling of the near surface region is applied to ultra-thin films examining growth modes and film closure mechanisms. With the dual Al/Ag monochromated sources it is possible to vary information depth for relative comparisons on the nature of the uppermost layers. New developments in cluster ion sources now allow soft biomaterials to be depth profiled. Accurate analysis of interfacial chemistry is possible without ion beam damage. XP Imaging will also be discussed for systems exhibiting surface inhomogeneity. Quantitative images yield useful additional information over conventional microscopies. Discussions will concentrate on both model systems and real life applications highlighting the latest possibilities of XPS for this growing field.
[1] Donald R. Miller and Nikolaos A. Peppas, Journal of Macromolecular Science, Part C Vol. 26 , Iss. 1,1986