| AVS 64th International Symposium & Exhibition | |
| Applied Surface Science Division | Friday Sessions |
| Session AS+MS-FrM |
| Session: | Unlocking the Sample History: Forensics and Failure Analysis |
| Presenter: | Thomas Beebe, Jr., University of Delaware |
| Authors: | T.P. Beebe, Jr., University of Delaware Z. Voras, University of Delaware C. Goodwin, University of Delaware K. deGhetaldi, University of Delaware B. Baade, University of Delaware J. Mass, University of Delaware |
| Correspondent: | Click to Email |
Connections between the science of surface analysis and the science of cultural heritage, such as it is, have been neither historically strong nor particularly productive, unfortunately for both fields. We are developing new collaborations aimed at changing this. Not all cultural heritage conservators adopt a scientific approach, and not all of those that do are willing to expand their scientific approaches to include surface-sensitive techniques such as XPS and TOF-SIMS, in many cases because their backgrounds have not led them to know about such methods. To be fair, we surface scientists don’t have all the answers and often can’t get them. Not all surface scientists are interested in pushing the boundaries of their sample types into such unconventional realms, and not all of those that are interested have the patience to develop the new sample-handling and sample-preparation techniques applicable to XPS and TOF-SIMS analysis, not to mention dealing with the ultra-small sample sizes of such precious works of art. This presentation will draw upon several recent examples from the speaker’s research team to show how XPS and TOF-SIMS can be used to shed some light on mechanisms of chemical and physical degradation, proposed and applied methods of stopping such degradation, and proposed and applied methods of repairing such degradation. The examples will come from a range of paintings and other art objects spanning from the Italian Renaissance to the post-Modern era.