AVS 64th International Symposium & Exhibition | |
2D Materials Focus Topic | Thursday Sessions |
Session 2D-ThP |
Session: | 2D Materials Poster Session |
Presenter: | Teng Cui, University of Toronto, Canada |
Authors: | T. Cui, University of Toronto, Canada C.H. Cao, University of Toronto, Canada S. Parambath Mundayodan, University of Toronto, Canada Y. Sun, University of Toronto, Canada T. Filleter, University of Toronto, Canada |
Correspondent: | Click to Email |
Highly oxidized bilayer GO films were prepared on perforated substrates by a solution-based method, from which different interlayer crystalline stacking angle and sagging depth were obtained and characterized. Atomic force microscopy-based mechanical testing revealed higher strength of aligned (small stacking angle) bilayers as compared to misaligned (large stacking angle) counterparts. Further transmission electron microscopy analysis of fracture surface revealed through-film fracture for the aligned case and individual layer cracking for the misaligned case, casting light on the origin of the strength discrepancy. In addition, the suspended GO films present different sagging depth, which in turn is found to effect the load carrying capacity and the fracture behavior significantly. Our results demonstrated that bilayer GO with ~165 nm sag doubles the fracture force as compared to ~ 40 nm sag. A deeper understanding of the configurational effect, e.g., stacking orientation and sagging, on the mechanical behavior will better facilitate engineering GO for various applications at different size scales.