| AVS 64th International Symposium & Exhibition | |
| 2D Materials Focus Topic | Tuesday Sessions |
| Session 2D+AS+SA+SP-TuM |
| Session: | 2D Materials Characterization including Microscopy and Spectroscopy |
| Presenter: | Hui Zhang, Shanghai Institute of Microsystem And Information Technology, China |
| Authors: | H. Zhang, Shanghai Institute of Microsystem And Information Technology, China J.-H. Guo, Lawrence Berkeley National Laboratory X. Sun, Soochow University |
| Correspondent: | Click to Email |