| AVS 62nd International Symposium & Exhibition | |
| Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | SA-MoA1 Operando Soft X-ray Spectromicroscopy on Electronic States of Graphene Transistors Hirokazu Fukidome, Tohoku University, Japan |
| 2:40pm | SA-MoA2 Micro-metric Electronic Patterning of a Topological Band Structure using a Photon Beam Nick de Jong, E. Frantzeskakis, B. Zwartsenberg, Y. Huang, B.V. Tran, P. Pronk, E. van Heumen, D. Wu, Y. Pan, University of Amsterdam, M. Radovic, Paul Scherrer Institute, N.C. Plumb, N. Xu, Paul Scherrer Institut, M. Shi, Paul Scherrer Institute, A. de Visser, M.S. Golden, University of Amsterdam |
| 3:00pm | SA-MoA3 Invited Paper Switching 2D Materials Properties with Light Alessandra Lanzara, University of California, Berkeley |
| 3:40pm | SA-MoA5 Invited Paper Science-driven Requirements for Soft X-ray Free Electron Lasers Fulvio Parmigiani, Elettra-Sincrotrone Trieste, Italy |
| 4:20pm | SA-MoA7 Invited Paper Revealing Spin Texture Dynamics in Complex Materials via Time-resolved Resonant Soft X-ray Scattering Robert Schoenlein, Lawrence Berkeley National Laboratory |
| 5:00pm | SA-MoA9 Invited Paper Electronic States of Functional Molecular Materials Probed by Low-energy Excitation Satoshi Kera, Institute for Molecular Science, Japan |