| AVS 62nd International Symposium & Exhibition | |
| Thin Film | Thursday Sessions |
| Session TF-ThP |
| Session: | Thin Films Poster Session |
| Presenter: | Seval Aksoy, Anadolu University, Turkey |
| Authors: | S.A. Aksoy, Anadolu University, Turkey Y. Caglar, Anadolu University, Turkey M. Caglar, Anadolu University, Turkey S. Ilican, Anadolu University, Turkey |
| Correspondent: | Click to Email |
Semiconductor materials have received much attention because of their novel properties. Zinc oxide (ZnO) has been attracting attention because of the commercial demand. It is well known that the addition of impurities into a wide band gap semiconductor. A selective doping element into ZnO has become an important route for enhancing and controlling its structural, morphological, electrical, and magnetic performance. The magnetic property in III–V semiconductors do not attract much attention for device fabrication. Ni is an important dopant in the magnetic materials. Additionally, Ni2+ (0.69 Å) has the same valence compared to Zn2+ and its radius is close to Zn2+ (0.74 Å), so it is possible for Ni2+ to replace Zn2+ in ZnO lattice.
In this work, undoped ZnO and Ni doped ZnO (ZnO:Ni) films have been deposited by sol–gel method using spin coating technique. As a starting material, zinc acetate dihydrate was used. 2-methoxyethanol and monoethanolamine were used as a solvent and stabilizer, respectively. The dopant source of Ni was nicel (II) acetate tetrahydrate. The effects of Ni concentration on the crystal structure and orientation of the ZnO films have been investigated using X-ray diffraction (XRD) study. The crystal structure and orientation of the ZnO film were determined to be a hexagonal wurtzite structure and a preferred orientation of (002). The average crystallite size, texture coefficient, dislocation density and lattice constants of the ZnO:Ni films were calculated. The average crystallite size values for the films was found to be in the range of 33–42 nm. The highest grain size value was obtained for the undoped ZnO film. Surface morphology of the films has been also studied by a field emission scanning electron microscope (SEM). The transmittance spectra of the films were measured to investigate their optical properties. All the films are highly transparent with average transmission (>81%) in the visible range. The optical constants of these films were determined using transmittance and reflectance spectra.
Acknowledgement: This work was supported by Anadolu University Commission of Scientific Research Project under Grant No. 1404F245