AVS 62nd International Symposium & Exhibition | |
Thin Film | Thursday Sessions |
Session TF+PS-ThA |
Session: | Thin Film Permeation Barriers and Membranes |
Presenter: | Fiona Elam, FUJIFILM Manufacturing Europe B.V., Netherlands |
Authors: | F.M. Elam, FUJIFILM Manufacturing Europe B.V., Netherlands A. Meshkova, DIFFER, Netherlands S.A. Starostin, DIFFER, Netherlands J.B. Bouwstra, FUJIFILM Manufacturing Europe B.V., Netherlands M.C.M. van de Sanden, DIFFER, Netherlands H.W. de Vries, DIFFER, Netherlands |
Correspondent: | Click to Email |
Atmospheric Pressure-Plasma Enhanced Chemical Vapour Deposition (AP-PECVD) is a new enabling technology that can be easily integrated into many existing manufacturing systems to facilitate the mass production of functional films. To date, roll-to-roll AP-PECVD has been successfully used to produce ultra-smooth, dense, 100 nm single layer silica-like thin films that demonstrate good water vapour barrier performance, therefore showing particular promise as a technique in the field of protective layer synthesis for flexible organic solar cells. However, this technology is only viable for moisture barrier production if high quality films can be manufactured at high throughput and at low cost. The generation of bi-layer silica-like thin films comprising a ‘dense layer’ synthesised using very low precursor gas flows deposited on top of a ‘porous layer’ synthesised at a high deposition rate, could provide one potential solution to this scientific challenge.
A glow-like AP dielectric barrier discharge in a roll-to-roll set-up was used to deposit a series of ~90 nm bi-layer silica-like thin films composed of a ~60 nm ‘porous layer’ and ~30 nm ‘dense layer’ onto a polyethylene 2,6 naphthalate substrate by means of AP-PECVD. Tetraethyl orthosilicate (TEOS) was used as the precursor gas, together with a mixture of nitrogen, oxygen and argon. In each case, the deposition conditions for the ‘porous layer’ were kept constant, while the conditions for the synthesis of the ‘dense layer’ were varied in order to study the effect of increased input energy per precursor gas molecule (~6 – 70 keV/TEOS molecule) on the chemical composition and porosity of the ‘dense layer’ and hence, the influence of this 30 nm layer on the moisture barrier performance of the overall film.
Each film was characterised in terms of its water vapour transmission rate, its chemical composition (s-, p- and un-polarised Attenuated Total Reflectance-Fourier Transform Infrared spectroscopy and X-ray Photoelectron Spectroscopy) and its morphology (Atomic Force Microscopy) as a function of the input energy per precursor gas molecule during the ‘dense layer’ deposition. The analysis provided valuable information concerning the structure of the silica network within each ‘dense layer’, and hence the influence of input energy per precursor gas molecule on the ultimate film quality.
The ~90 nm bi-layer silica-like thin films were seen to exhibit water vapour transmission rates of at least 6.2 ×10-4 g m-2 day-1 (at 40oC, 90% RH), illustrating that it is possible to produce exceptionally high quality moisture barrier films using the presented bi-layer approach in a roll-to-roll AP-PECVD set-up.