AVS 62nd International Symposium & Exhibition | |
Thin Film | Wednesday Sessions |
Session TF+AS+EM+EN+MN-WeA |
Session: | CV Infiltration Methods and Energetic and Thermal Properties of Thin Films |
Presenter: | Nathan Boyer, Brigham Young University |
Authors: | N. Boyer, Brigham Young University D.B. Syme, Brigham Young University J.T. Rowley, Brigham Young University M. Harker, Moxtek Inc. R. Creighton, Moxtek Inc. S. Cornaby, Moxtek Inc. R. Vanfleet, Brigham Young University B.D. Iverson, Brigham Young University L. Pei, Johns Hopkins University R.C. Davis, Brigham Young University |
Correspondent: | Click to Email |