AVS 62nd International Symposium & Exhibition
    Scanning Probe Microscopy Focus Topic Thursday Sessions
       Session SP-ThP

Paper SP-ThP2
High Resolution qPlus NC-AFM with a New Cryogen-Free Variable Temperature UHV SPM

Thursday, October 22, 2015, 6:00 pm, Room Hall 3

Session: Scanning Probe Microscopy Poster Session
Presenter: Bjoern Piglosiewicz, Oxford Instruments
Authors: C. Troeppner, Oxford Instruments
M. Atabak, Oxford Instruments
S. Molitor, Oxford Instruments
J. Koeble, Oxford Instruments
B. Piglosiewicz, Oxford Instruments
J. Chrost, Oxford Instruments
Correspondent: Click to Email
We present first qPlus[1] NC-AFM results of a new cryogen-free cooled ultra-high vacuum compatible scanning probe microscope capable of high stability STM and qPlus NC-AFM operation at temperatures ranging from low temperature up to above room temperature.

The microscope features a cold-sample and cold-tip design. Overcoming the limits of hold time of cryogenic liquids by the cryogen-free approach this microscope provides access to new classes of experiments. Combining drift values much smaller than 1A/h and stable tip conditions enable e.g. unsurpassed long-term spectroscopic SPM measurements.

Decoupling the strong mechanical vibrations induced by the pump of the closed cycle cooler represents a major technical challenge. Our design of the cryogen-free microscope effectively decouples the inherent mechanical vibrations to a level of state-of-the art low temperature SPM’s utilizing cryogenic liquids.

References

[1]] patented, cf. Franz J. Giessibl, APL, Vol. 73, No. 26 (1998)