| AVS 62nd International Symposium & Exhibition | |
| Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic | Monday Sessions |
| Session SA-MoM |
| Session: | Imaging and Nanodiffraction (8:20-10:00 am) & Novel Insights in Correlated Materials, Organic Materials and 2D Solids (10:40 am -12:00 pm) |
| Presenter: | Adam Hitchcock, McMaster University, Canada |
| Authors: | A.P. Hitchcock, McMaster University, Canada X.H. Zhu, McMaster University, Canada J. Wu, McMaster University D. Shapiro, Lawrence Berkeley Lab, University of California, Berkeley T. Tyliszczak, Lawrence Berkeley Lab, University of California, Berkeley |
| Correspondent: | Click to Email |
Recent improvements in instrumentation and data analysis for soft X-ray spectromicroscopy and spectro-ptychography have made significant advances in spatial resolution and sensitivity. These improvements are providing researchers with new tools to contribute to solving real world technological issues as well as making fundamental discoveries. This presentation will give an overview of the performance of current instrumentation, report on exciting advances taking place in soft X-ray spectro-ptychography, and outline opportunities for in situ and operando studies. Spectro-ptychography studies of the magnetism of individual magnetosomes in magnetotactic bacteria by X-ray magnetic circular dichroism (XMCD). Results for 2D and 3D chemical analysis of polymer-electrolyte fuel cells will be presented.
Research performed at the Advanced Light Source, funded by DoE, BES, and at the Canadian Light Source, funded by CFI, NSERC, U. Saskatchewan, Saskatchewan, WEDC, NRC and the CIHR. The SHARP code used for ptychographic data analysis was developed by the Center for Applied Mathematics for Energy Research Applications (CAMERA) at LBNL, led by Jamie Sethian, in collaboration with Uppsala University .