AVS 62nd International Symposium & Exhibition
    In-Situ Spectroscopy and Microscopy Focus Topic Tuesday Sessions
       Session IS+AS+SA+SS-TuM

Paper IS+AS+SA+SS-TuM4
Toward Ambient Pressure Electron Spectroscopy with Conventional XPS Instrumentation

Tuesday, October 20, 2015, 9:00 am, Room 211C

Session: In-situ Studies of Solid-liquid Interfaces
Presenter: Andrei Kolmakov, National Institute of Standards and Technology (NIST)
Correspondent: Click to Email
The current state of the art instrumentation for ambient pressure electron spectroscopy requires highly specialized sophisticated laboratory equipment or dedicated synchrotron radiation facilities. The limited access to these equipment impedes in situ (in vivo) studies under realistic conditions in catalysis, energy, environmental and bio-(medical) fields. We propose a new sample platform which enables ambient pressure XPS to be conducted using conventional XPS instrumentation. The core of the sample platform is microchannel environmental cells sealed with electron transparent, molecularly impermeable, mechanically and chemically stable graphene layer. The channels can be impregnated with liquids or gases and yet be vacuum compatible. Two major wafer scale fabrication strategies: (i) transferred graphene and (ii) as grown graphene layer were described. The coverage yield, membrane cleanness and leaking rates were comparatively studied. The feasibility tests of the platform included in situ XPS and electron microscopy studies of the water radiolysis and electrochemical processes taking place at liquid electrolyte-solid interface.