| AVS 61st International Symposium & Exhibition | |
| Scanning Probe Microscopy Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| SP+AS+EM+NS+SS-ThP2 Fabrication of Single-Walled Carbon Nanotube Probe and Processing of Single Nanometer Scale Pit with High-Aspect-Ratio of Highly Oriented Pyrolytic Graphite Using by STM Syun Ohsumimoto, A. Matsumuro, Aichi Institute of Technology, Japan |
| SP+AS+EM+NS+SS-ThP3 Probing the Electronic Structure of the Layered Electride Ca2N Jeonghoon Ha, NIST/Maryland Nano Center, University of Maryland, H. Baek, NIST & Seoul National University, Republic of Korea, D. Zhang, NIST/Maryland Nano Center, University of Maryland, Y. Kim, S. Kim, Y.J. Song, Sungkyunkwan University, Republic of Korea, Y. Kuk, Seoul National University, Republic of Korea, J.A. Stroscio, NIST |
| SP+AS+EM+NS+SS-ThP5 Improving the Accuracy of Atomic Force Microscopy in Nanometrology for Linewidth Measurements James Su, N.N. Chu, M.H. Shiao, C.N. Hsiao, Instrument Technology Research Center, National Applied Research Laboratories, Taiwan, Republic of China |
| SP+AS+EM+NS+SS-ThP8 The Effect of Electrochemical Potential on Single Molecule Conductance Esteban Sanchez, R. Aguilar, BUAP, Mexico, S. Afsari, Temple University, Z. Li, Ball State University, E. Borguet, Temple University |