AVS 61st International Symposium & Exhibition
    Applied Surface Science Friday Sessions

Session AS+MC+SS-FrM
Practical Surface Analysis II

Friday, November 14, 2014, 8:20 am, Room 316
Moderator: Steven Pachuta, 3M Company


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:20am AS+MC+SS-FrM1
Vector Potential Photoelectron Microscopy
Raymond Browning, R. Browning Consultants
8:40am AS+MC+SS-FrM2
Hydrogen and Chemical Quantification of an Organic Coating
Paul Mack, Thermo Fisher Scientific, UK
9:00am AS+MC+SS-FrM3
Mechanical Strain Induced Tunable Reflective and Conducting Silver Nanorods Embedded PDMS Film
Pratibha Goel, J.P. Singh, Indian Institute of Technology, India
9:40am AS+MC+SS-FrM5
Surface Analysis of Electronic Materials
R.L. Opila, Kevin Jones, J. Church, University of Delaware, R. Gupta, V. Pallem, B. Lefevre, Air Liquide, X. Lin, University of Delaware
10:40am AS+MC+SS-FrM8
Lewis Base Sites on the Nitrogen-Doped Graphite Surfaces Probed by CO2 Adsorption
Takahiro Kondo, R. Shibuya, S. Morohoshi, D. Guo, J. Nakamura, University of Tsukuba, Japan
11:00am AS+MC+SS-FrM9
Towards Spin-FETs: Growth and Characterization of Magnetoelectric Chromium Oxide Films on Graphene
Sean Stuart, E. Sachet, J.-P. Maria, J.E. Rowe, D.B. Dougherty, North Carolina State University, M. Ulrich, Army Research Office
11:20am AS+MC+SS-FrM10
Energy Loss Of Highly Charged Ions Implanted In MOS Dielectric Films
Radhey Shyam, D.D. Kulkarni, D.B. Cutshall, J.E. Harriss, W.R. Harrell, C.E. Sosolik, Clemson University