| AVS 61st International Symposium & Exhibition | |
| Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS+BI+MC-WeM2 Expanded Approaches for Single Cell Analysis by SIMS Christopher Szakal, National Institute of Standards and Technology (NIST) |
| 8:40am | AS+BI+MC-WeM3 Invited Paper 3-Dimensional Chemical Imaging on the Nanoscale with Cluster-SIMS Nicholas Winograd, Penn State University |
| 9:20am | AS+BI+MC-WeM5 SIMS 2D and 3D Characterization of Organic/Inorganic Surfaces by FIB Crater Wall Imaging and Tomography Felix Kollmer, R. Möllers, D. Rading, S. Kayser, ION-TOF GmbH, Germany, N. Havercroft, ION-TOF USA, Inc., E. Niehuis, ION-TOF GmbH, Germany |
| 9:40am | AS+BI+MC-WeM6 Multivariate Imaging: A New Approach towards Chemical State Identification of Novel Carbons in XPS Imaging Anders Barlow, N. Sano, P.J. Cumpson, NEXUS, Newcastle University, UK |
| 11:00am | AS+BI+MC-WeM10 Invited Paper Multivariate Analysis Approaches for Image De-noising and Image Fusion Bonnie Tyler, National Physical Laboratory (NPL), UK |
| 11:40am | AS+BI+MC-WeM12 Global Analysis Peak Fitting for Imaging NEXAFS Data Mark H. Van Benthem, J.A. Ohlhausen, Sandia National Laboratory |
| 12:00pm | AS+BI+MC-WeM13 Visualizing Pharmaceutical Compounds in Single-cells with label-free 3D Mass Spectrometry Imaging Melissa K. Passarelli, C. Newman, National Physical Laboratory, UK, A. West, University of York, UK, C.T. Dollery, I.S. Gilmore, National Physical Laboratory, UK, J. Bunch, National Physical Laboratory |