AVS 61st International Symposium & Exhibition
    Surface Science Thursday Sessions
       Session SS+AS+NS-ThA

Paper SS+AS+NS-ThA4
Morphology Dependence of Gas-Phase Molecule Interactions with GaAs Surfaces

Thursday, November 13, 2014, 3:20 pm, Room 309

Session: Semiconductor Surfaces and Interfaces 1
Presenter: Sylwia Ptasinska, University of Notre Dame
Authors: S. Ptasinska, University of Notre Dame
X.Q. Zhang, University of Notre Dame
Correspondent: Click to Email

A great deal of progress has been made in understanding molecular interactions at the interface of two-dimensional GaAs systems under ultra-high vacuum (UHV) conditions. While research on understanding of such interactions with lower-dimensional GaAs-based structures, such as one-dimensional nanowires (NWs), has not been performed despite the potential importance of these structures for developing nano-electronic circuits. Moreover, surface characterization of GaAs under more realistic than the UHV studies, are critical in any attempt to correlate surface chemistry with device properties.

Nowadays, due to recent developments in the surface characterization techniques, and especially the development of Near Ambient Pressure X-ray Photoelectron Spectroscopy (NAP XPS) [1], we are able to track surface chemistry in-situ under elevated pressures and temperatures for different morphologies.

In our present study we used NAP XPS to investigate the interaction of a radically non-planar GaAs surface comprised of an ensemble of GaAs NWs with O2 and H2O molecules. In this study the evolution of O2 and H2O molecule dissociation on GaAs NWs is tracked under in-situ conditions as a function of temperature and gas pressure to establish whether these processes depend on surface morphology. In contrast to ideally flat GaAs single crystal surfaces that are previously studied [2], gas molecules experienced the enhanced dissociation on GaAs NW ensembles due to an increase in the surface area ratio and the presence of stepped edges, atom vacancies, and other defects on non-flat semiconductor surfaces [3].

[1] D. E. Starr, Z. Liu, M. Havecker, A. Knop-Gericke, and H. Bluhm, Investigation of solid/vapor interfaces using ambient pressure X-ray photoelectron spectroscopy, Chem. Soc. Rev. 42, 5833-5857 (2013)

[2] X. Zhang, S. Ptasinska, Dissociative Adsorption of Water on an H2o/GaAs(100) Interface-in-Situ near Ambient Pressure XPS Studies, J. Phys. Chem. C 118, 4259-4266 (2014)

[3] X. Zhang, E. Lamere, X. Liu, J. K. Furdyna, S. Ptasinska, Morphology Dependence of Interfacial Oxidation States of Gallium Arsenide under near Ambient Conditions, Appl. Phys. Lett. DOI:10.1063/1.4874983 (2014)