AVS 61st International Symposium & Exhibition
    Surface Science Tuesday Sessions
       Session SS+AS+EN-TuM

Paper SS+AS+EN-TuM10
The Growth of Catalytic Thin Films on a Polar Substrate: Cr2O3 on ZnO (0001) and ZnO (000-1)

Tuesday, November 11, 2014, 11:00 am, Room 309

Session: Synthesis, Structure and Characterization of Oxides
Presenter: Xiaodong Zhu, Yale University
Correspondent: Click to Email

Zinc oxide is a wurtzite-structured polar crystal with dramatic polarization direction-dependent surface chemistry. Meanwhile, chromium III oxide is a non-polar material catalytically active for a number of industrial chemical reactions, most notably dehydrogenation. Therefore, the Cr2O3/ZnO system has been chosen to demonstrate how the polarization direction of a substrate can be exploited tailor the surface properties of catalytically active non-polar thin films. Photoelectron spectroscopy and electron diffraction have been performed to determine the growth mode as well as the film quality. The growth is 2D; however, the films appear initially disordered on both positive and negatively poled substrates. On both substrates the order was observed to improve with thickness. Small band offsets between Cr2O3 and oppositely poled substrates were observed that were consistent with charge compensation at the Cr2O3/ZnO interface. No obvious change in the oxidation state of the chromium was seen and so it is assumed that the charge compensation at the interface only involves Zn and/or O. The offset between the Cr peaks on positively and negatively poled substrates was obvious at the initial growth stages but then decayed with film thickness, suggesting that the compensating charges at the interface may migrate to the film surface. Valence band spectra were analyzed to characterize the bonding at the interface. The surface chemical behavior of Cr2O3 on the two zinc oxide surfaces is being characterized to determine how significantly the polar interface impacts the surface properties of thin supported layers.