AVS 61st International Symposium & Exhibition
    Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic Monday Sessions
       Session SA-MoM

Invited Paper SA-MoM8
Correlative Probing of the Surface Chemistry and Electron Transport of Nanodevices in Operando Mode using Scanning Photoelectron Emission Microscopy

Monday, November 10, 2014, 10:40 am, Room 312

Session: Synchrotron Studies of Processes in Energy Conversion, Electronic Devices and Other Materials I
Presenter: Andrei Kolmakov, National Institute of Standards and Technology (NIST)
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The surface as well as interfacial properties of nanoscopic devices are intimately linked to their electronic transport properties. In addition, they have a strong dependence on their dimensions, faceting and stoichiometry. As a result, the traditional measurements on the ensembles of nanostructures would suffer from significant averaging effects and need to be replaced with testing of individual well characterized nanostructure. In this report, we demonstrate few examples of correlative imaging, spectroscopy and transport measurements on individual working nanodevices using capabilities of modern synchrotron radiation based photoelectron microscopy. In particular, the surface analysis of the operating MEMS nanowire sensor model device being coupled with scanning x-ray beam induced current microscopy correlates real time changes in conductance of the nanowire with formation of the specific surface groups upon redox reaction. The effect of the electrodes and electroactive defects in the devices on their performance will be discussed. The perspectives of the in operando device characterization at real world pressures and temperatures will be outlined.