| AVS 61st International Symposium & Exhibition | |
| Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic | Monday Sessions |
| Session SA-MoM |
| Session: | Synchrotron Studies of Processes in Energy Conversion, Electronic Devices and Other Materials I |
| Presenter: | Conan Weiland, Synchrotron Research, Inc. |
| Authors: | C. Weiland, Synchrotron Research, Inc. Z. Fu, National Institute of Standards and Technology C. Jaye, National Institute of Standards and Technology D.A. Fischer, National Institute of Standards and Technology K. Scammon, University of Central Florida P.E. Sobol, Synchrotron Research, Inc. E.L. Principe, Synchrotron Research, Inc. |
| Correspondent: | Click to Email |
We present the development of a Large Area Rapid Imaging Analytical Tool (LARIAT MKII) for near edge x-ray absorption fine structure (NEXAFS) surface chemical and structural analysis. This analyzer utilizes magnetostatic and grid-less electrostatic lenses to maintain the lateral distribution of electrons into a 16 mega channel detector, allowing for a 180° collection angle for high collection efficiency enabling rapid parallel imaging. The system is in development for installation at the NIST SST beamline at NSLS II. Initial images from LARIAT MKII, currently installed at NSLS, will also be presented. The images demonstrate the system’s imaging capabilities, with resolution approaching 5 μm for C K-edge images.