AVS 61st International Symposium & Exhibition
    Exhibitor Technology Spotlight Wednesday Sessions
       Session EW-WeL

Paper EW-WeL4
The Workstation For Your 2D Characterization Needs - The First Low Temperature MultiProbe SPM-NSOM System Integrated with Raman

Wednesday, November 12, 2014, 1:20 pm, Room Hall ABC

Session: Exhibitor Technology Spotlight Session
Presenter: David Lewis, Nanonics Imaging Ltd.
Correspondent: Click to Email

The Nanonics CryoView MP is the ideal SPM platform for studying mechanical, optical, and electrical nanoscale properties of 2D materials at low temperature. Materials such as graphene, hexagonal boron nitride (h-BN), dichalcogenides (e.g.) MoS2, etc. The CryoView MP is uniquely suited to conduct studies in dynamics, photoconductivity, electrical conductivity, and other phenomenon of such materials. Very sensitive and stable tip- sample interaction control through the tuning fork feedback mechanism allows for high resolution SPM measurements. The open optical access allows for a variety of optical integrations including near-field, Raman, TERS and fluorescence measurements. Multiple probes allows for a variety of electrical measurements including MFM, EFM, KPM and thermal measurements. The CryoView MP opens up many new possibilities for exciting research in your 2D materials.