AVS 61st International Symposium & Exhibition
    Exhibitor Technology Spotlight Wednesday Sessions
       Session EW-WeA

Paper EW-WeA6
FOCUS beyond PEEM and NanoESCA

Wednesday, November 12, 2014, 4:00 pm, Room Hall ABC

Session: Exhibitor Technology Spotlight Session
Presenter: Dieter Pohlenz, FOCUS GmbH, Germany
Authors: D. Pohlenz, FOCUS GmbH, Germany
M. Escher, FOCUS GmbH, Germany
M. Weber, FOCUS GmbH, Germany
Correspondent: Click to Email
FOCUS is an owner-managed German company situated in Hünstetten close to Wiesbaden. Since its establishment in 1990, FOCUS has been engaged in the field of electron beam evaporation, electron spectroscopy and electron microscopy and in scientific apparatus construction generally. Most recent developed products are the focused VUV-source HIS 14 HD and the universal UHV Ion Source FDG 150. The HIS 14 HD source delivers a spot diameter of 300μm for angle resolved photoemission spectroscopy using technology developed at synchrotron beam lines. We list the mounting requirements and show first ARPES results. The FDG 150 is designed for depth profile analysis in XPS- and Auger Spectroscopy and charge neutralization (ESCA). Further applications are sample cleaning and sensor cleaning in scanning probe microscopy and the use as excitation source for ISS/LEIS analysis. The FERRUM spin polarization detector is the latest FOCUS product for spin analysis which can be combined with state of the art electron spectrometers.