Oxford Instruments Asylum Research will present the latest AFM innovations for nanoelectrical characterization that provide new information that was inaccessible by previous techniques: • Scanning Microwave Impedance Microscopy (sMIM) for conductivity and permittivity mapping on insulators, semiconductors and conductors • Nanoscale time dependent dielectric breakdown (NanoTDDB) with the spatial resolution of an AFM tip • Dual Gain CAFM to measure current from 1 pA to 10 µA with sub-pA sensitivity on samples with widely varying conductivity We’ll also present an overview and the latest results of AFM mapping modes that calculate both the elastic and loss modulus: • AM-FM Viscoelastic Mapping Mode for quantitative nanomechanics with the resolution, ease of use and speed of tapping mode • Contact Resonance Viscoelastic Mapping Mode for quantitative nanomechanics on materials from 1 GPa to 100's Gpa