| AVS 60th International Symposium and Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | EL+AS+EN+PS+SS+TF-ThM1 Invited Paper Application of Spectroscopic Ellipsometry for the Characterization of Various Solar Cell Devices H. Fujiwara, Gifu University, Japan |
| 9:00am | EL+AS+EN+PS+SS+TF-ThM4 Real-Time and Through-the-Glass Mapping Spectroscopic Ellipsometry for Analysis of CdS/CdTe Coated Superstrates and Correlations with Solar Cell Performance P. Koirala, J. Chen, X. Tan, R.W. Collins, The University of Toledo |
| 9:20am | EL+AS+EN+PS+SS+TF-ThM5 Invited Paper Expanded Beam Spectroscopic Ellipsometry for In-line Monitoring of Thin Film Process M. Fried, Hungarian Academy of Science, Hungary |
| 10:40am | EL+AS+EN+PS+SS+TF-ThM9 Invited Paper Materials Characterization using THz Ellipsometry and THz Optical Hall Effect T. Hofmann, University of Nebraska-Lincoln |
| 11:20am | EL+AS+EN+PS+SS+TF-ThM11 A History of Early Ellipsometry and Polarimetry R.A. Synowicki, J.A. Woollam Co., Inc. |
| 11:40am | EL+AS+EN+PS+SS+TF-ThM12 Vibrational Properties of Lanthanum Aluminate and Magnesium Aluminate Spinel Using Fourier Transform Infrared Ellipsometry T. Willett-Gies, New Mexico State University, C.J. Zollner, Cornell University, E. DeLong, S. Zollner, New Mexico State University |