AVS 60th International Symposium and Exhibition | |
Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
2:00pm | AS-WeA1 Invited Paper Albert Nerken Award Lecture - Photocathodes for Future X-ray Light Sources H.A. Padmore, Lawrence Berkeley National Laboratory |
2:40pm | AS-WeA3 Monochromatic Ag Lα for XPS – A Practical High Energy X-ray Source S.J. Coultas, J.D.P. Counsell, S.J. Hutton, A.J. Roberts, C.J. Blomfield, C. Moffitt, D. Surman, Kratos Analytical Limited, UK |
3:00pm | AS-WeA4 Industrial Applications of Auger Electron Spectroscopy (AES) in GE Research and Development Laboratory H. Piao, L. Le Tarte, General Electric Co., D.F. Paul, Physical Electronics Inc. |
4:00pm | AS-WeA7 Invited Paper Developing Electron Spectroscopy to Meet the Characterization Needs of Modern Materials – Past, Present and Future Challenges D.R. Baer, Pacific Northwest National Laboratory |
4:40pm | AS-WeA9 Quantifying the Oxidation of Artificially Aged Elastomers with Multivariate Analysis and Imaging NEXAFS J.A. Ohlhausen, M.H. Van Benthem, M.C. Celina, Sandia National Laboratories |
5:00pm | AS-WeA10 Quantitative Characterization of Corrosion Oxides on Metal Alloy Surfaces Exposed to High Temperature Water M.C. Burrell, J.T. Orr, T.K. Nolan, M.J. LeClair, Bechtel Marine Propulsion Corporation |
5:20pm | AS-WeA11 Surface Preparation for Multitechnique Surface Analyses A.E. Wright, P. Mack, T.S. Nunney, A. Bushell, Thermo Fisher Scientific, UK |
5:40pm | AS-WeA12 Interface Analysis of ALD Grown Oxides using Tunable HAXPES J. Church, J. Krajewski, R. Opila, University of Delaware, C. Weiland, National Institute of Standards and Technology (NIST) |