| AVS 60th International Symposium and Exhibition | |
| Applied Surface Science | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | AS-TuM1 Invited Paper Chemical Analysis of Surfaces and Ultra-thin Films: At the Forefront of XPS Analytical Methods A. Rossi, Università degli Studi di Cagliari and ETH Zurich, Italy |
| 8:40am | AS-TuM3 Sample-Morphology Effects on XPS Peak Intensities: Estimation of Detection Limits C.J. Powell, National Institute of Standards and Technology (NIST), W.S.M. Werner, W. Smekal, Technical University of Vienna, Austria |
| 9:00am | AS-TuM4 The Active-Background Method in XPS Data Peak-fitting A. Herrera-Gomez, CINVESTAV-Queretaro, Mexico |
| 9:20am | AS-TuM5 Angle-Resolved XPS of Compound Semiconductors: A Straightforward Route beyond the "Relative Depth" Plot A. Barlow, P. Cumpson, NEXUS, Newcastle University, UK |
| 9:40am | AS-TuM6 The Effect of Electronic Relaxation on the First-Principles Prediction of XPS Spectra K. Artyushkova, S. Akbir, University of New Mexico, B. Kiefer, New Mexico State University |
| 10:40am | AS-TuM9 XPS for Characterisation of Optical and Electronic Devices under Operation S. Suzer, Bilkent University, Turkey |
| 11:00am | AS-TuM10 Practical Auger Spectroscopy M.D. Johnson, Hewlett Packard, D.F. Paul, Physical Electronics Inc., W.F. Stickle, Hewlett Packard, J.F. Moulder, Physical Electronics Inc. |
| 11:20am | AS-TuM11 Angle-resolved Photoemission from Curved Surfaces J.E. Ortega, Universidad del País Vasco, Spain, F.M. Schiller, J. Lobo-Checa, CSIC, Spain, A. Mugarza, Institut Catala de Nanotecnologia, Spain |
| 11:40am | AS-TuM12 Uncovering the Mechanism of Bioleaching of Enargite by XPS M. Fantauzzi, B. Elsener, G. Rossi, A. Rossi, Università degli Studi di Cagliari, Italy |