AVS 60th International Symposium and Exhibition | |
Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
8:20am | AS+BI+IS-WeM2 Invited Paper Rapid Evaporative Ionization Mass Spectrometry - Principles and Applications Z. Takats, Imperial College, London, J. Balog, MediMass Ltd., Hungary |
9:00am | AS+BI+IS-WeM4 A Microplasma VUV Photoionization Source for Ambient Mass Spectrometry J.M. Symonds, R.D. Gann, F. Fernández, T.M. Orlando, Georgia Institute of Technology |
9:20am | AS+BI+IS-WeM5 Advances in Pulsed-Plasma Sources for Surface Analysis by Ambient Mass Spectrometry J.W. Bradley, K. McKay, A. Bowfield, University of Liverpool, UK, T.L. Salter, National Physical Laboratory, UK, J.W. Walsh, University of Liverpool, UK, M.R. Alexander, D.A. Barrett, University of Nottingham, UK, I.S. Gilmore, National Physical Laboratory, UK |
9:40am | AS+BI+IS-WeM6 Comparison of Ambient Pressure Ionization Sources by Determining Useful Yields of Forensic Compounds of Interest T. Brewer, C. Szakal, E. Sisco, S. Muramoto, T. Forbes, G. Gillen, NIST |
10:40am | AS+BI+IS-WeM9 Invited Paper Atmospheric Pressure Ionization Mass Spectrometry: Fundamentals, Simulations, and Applications Th. Benter, University of Wuppertal, Germany |
11:20am | AS+BI+IS-WeM11 Ambient Mass Spectrometry for Structural Analysis of Organic Monolayers H. Zuilhof, Wageningen University, Netherlands |
11:40am | AS+BI+IS-WeM12 Differentiation of Microbial Species & Strains in Coculture Biofilms by Multivariate Analysis of Laser Desorption Postionization Mass Spectra C. Bhardwaj, Y. Cui, University of Illinois at Chicago, H.C. Bernstein, R.P. Carlson, Montana State University, L. Hanley, University of Illinois at Chicago |